Showing results: 946 - 960 of 1333 items found.
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NI
PXI RF Analog Signal Generators deliver the functionality of RF signal generators to the modular, compact PXI form factor. These modules support frequency ranges from 250 kHz to 20 GHz. You can combine PXI RF Analog Signal Generators with other PXI modular instrumentation to design automated test systems for radar, RF integrated circuits (RFICs), and automotive test applications.
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Cincinnati Test Systems
Cincinnati Test Systems (CTS) provides our customers with turnkey systems that include the design, manufacture and support of custom built lean cell and automated functional equipment testing solutions. We are a recognized global leader for providing test solutions integrated with advanced technology, precision instrumentation, information software written by CTS engineers with proven experience, and supported by a team of technical application specialist.
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IVCT -
PSE Instruments GmbH
In recent years, we have been developing a sophisticated IV curve tracer for PV modules including a maximum power point tracking (MPPT) function. The IV curve tracer is designed for operation with any market-available steady-state solar simulator. Through our web-based software design, the operator can supervise the test results from every computer in a company network. The software contains functions such as an irradiation sum counter that helps to check requirements stated in a stabilization test like they are defined in IEC 61215 (MQT 19). We have also included a correction function to correct the traced IV curves to standard test conditions (STC) when the user enters the required temperature coefficients. One of the most important features is the multi-IV curve tracing function, which enables the user to display more than 150 IV curves in one graph. This eases the analysis of the weakest cells in hot-spot tests, which are required in IEC 61730 (MST 22) and IEC 61215 (MQT 09).
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AIM GmbH
AIM’s > ARINC 429 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O.
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DY100 -
Neutronics Manufacturing Co.
DY-100 is a new generation, fully automatic, transformer turns ratio tester designed for measuring ratio, ratio error of single and three phase transformers. The entire test is done automatically and quickly. Operator enters the test parameters and DY-100 tak es over; powers up the voltage, balances the bridge, takes the readings, and displays the results on the LCD screen. Prints testresults through its built-in printer. A key feature of the DY-100 is automatic measure transformer connection group. LV and HV windings are automatically isolated once the measurement is over. True portability is achieved by the lightweight (only 10 kg), single unit design housing the DY-100. The DY-100 is encased in an aluminum alloy cabinet.
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1659 -
IET Labs
The GenRad 1659 Digibridge RLC Tester is an easily programmable, microprocessor-based high performance passive component tester. It automatically identifies the type of component under test and measures in the proper range. The result is simple, precise, unambiguous RLC component testing. The GenRad 1659 RLC Digibridge is an instrument for measuring primary parameters of inductance (L), capacitance (C) and resistance (R) and secondary parameters of dissipation factor (D) and quality factor (Q). GenRad designed this single compact unit with maximum flexibility and operator convenience in mind. The simple front panel design of the Digibridge requires less effort to operate. Digital display and user friendly control allows test parameters and limits to be set easily.
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Data Patterns Pvt. Ltd.
VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in the industry today.Further enhancements of functional capabilities are achieved by the use of VXI IP carriers and VXI M Module carriers. This extends standard functions available from Data Patterns in these mezzanine architectures to the VXI platform.
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WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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BK2120A -
BaKo Co., Ltd
Our new, upgraded BK2120A is a complete system for testing both acoustical features and rub & buzz in microspeakers, receivers and earphones or earbuds. It is just as fast and easy to use as our "Classic" BK2120A speaker tester, but because it connects with a LAN cable, you can use it with a notebook, as well as a PC. Its new modular design also makes maintenance more convenient and the redesigned BS1123 software is even easier to use and more versitile than the old version. You still get both graphical and numeric test data but with more display options than before. We still customize our machine to your special needs and of course you can still save your data to analyze later. Easier setup, improved design, more features, easier to use: we expect our new BK2120A to be even more popular than the original!
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Celadon
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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AEP Technology
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
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NI
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Model 3541 -
Jinan Testing Equipment IE Corporation
The Model 3541 is designed for determination of fracture mechanics parameters such as JIC, KIC, R-curve, fatigue crack growth rate (da/dN), and testing to standards such as E1820, E399, E647, etc. These COD gages conform to the requirements of E1820 (the replacement for E813 and E1737) for JIC and R-curve determination. Special configurations are available to meet the requirements of ASTM E399 for fracture toughness (please consult the factory for these configurations). In addition, the modified groove design complies with E1820 tests where greater stability and accuracy results from the sharper groove root. Clip-on gages are used for a variety of fracture mechanics tests, including compact tension, arc shaped, disk shaped, bend specimens or other specimen geometries in compliance with ASTM and other standards organization’s test methods. Clip-on gages can be used directly on test specimens where the knife edges are integral with the test specimen or, alternately, with optional bolt-on knife edges mounted on the test specimen.The Model 3541 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.
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M41d -
Teledyne LeCroy quantumdata
The Teledyne LeCroy quantumdata M41d HBR3 Video Analyzer/Generator for DisplayPort Testing is a compact versatile test instrument offering entry level functional testing that can be extended through software licenses to a full compliance tester with sophisticated analysis and diagnostic capabilities. The M41d enables design and test engineers to validate their products for interoperability and reliability for the DisplayPort 1.4 video interface. The M41d is a flexible test instrument that can be upgraded from a functional tester for sources and sinks to a sophisticated analyzer and, if desired, can test full standards compliance, enabling developers to pre-test or self-test independently, reducing delays and costs during the product development cycle.
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ERAVANT
Wide mechanical tuning bandwidth Gunn oscillators utilize high performance GaAs Gunn diodes and various cavity designs to yield near full band frequency coverage. Unlike dual-tuner oscillators, frequency and power optimization are accomplished by a single micrometer. Furthermore, these oscillators can be modified into electrically tunable oscillators by replacing the micrometer with an electrical actuator. The wide tuning bandwidth of these oscillators offers a low cost, high performance means of signal generation, making them ideal test sources for labs and antenna ranges. While standard models offer a waveguide interface, a coaxial interface is also available. When used with a Gunn oscillator regulator/modulator (SOR series), these oscillators can produce AM or FM modulated signals for many test applications.
